Characterization
X-ray diffraction analysis
The structural properties and phase compositions of the synthesized nanocomposites with different molar ratios of CdS:CeO2 were analyzed by X-ray diffraction analysis using Philips X’PERT with Cu-Kα radiation having a scan speed of 2°/min at 25 °C.
The X-ray diffraction pattern of the synthesized CdS/CeO2 nanocomposites is represented in Fig. 3a. The peaks occurring at 2θ = 26.8, 43.9, and 52.0, in the XRD spectrum of pristine CdS, could be indexed to the (111), (220), and (311), planes of hexagonal CdS (compared with JCPDS Card No…
Continue Reading
News Source: www.nature.com