Antiferromagnetic interlayer exchange coupled Co68B32/Ir/Pt multilayers

Two SAF systems grown via magnetron sputtering (see “Methods” section) are probed for this work. When engineering these systems, it is crucial to extract the thickness of the materials, especially the Ir thickness required to induce the AFM coupling. These thicknesses were computed by doing low angle X-ray reflectometry scans, and fitting them with GenX⁴⁸ (see Supplementary Fig. S1a and b).

We will first discuss both systems separately, then compare their properties.

System 1: [CoB/Ir/Pt]_xN

Figure 1a shows the system referred to as system 1, designed with N…